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Title: 16-bit Booth Multiplier with 32-bit Accumulate
Page Link: 16-bit Booth Multiplier with 32-bit Accumulate -
Posted By: bhanu sandeep
Created at: Thursday 17th of August 2017 05:31:33 AM
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Introduction

This report presents three main topics we investigated as part of a project to build a Booth encoded multiply/accumulate VLSI chip. The original scope of work included synthesizing VHDL code using the Mentor Graphics tools. Exemplar was the VHDL compiler. Leonardo Spectrum was the synthesizer. Since my team, which included Kevin Delaney, did not meet a Mosis deadline our chip funding was lost. Since we did not actually fabricate a chip, we cannot discuss the success of our results. Likewise, VHDL synthesis using the Exemp ....etc

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Title: Driving and the Built Environment The Effects of Compact Development on Motorized T
Page Link: Driving and the Built Environment The Effects of Compact Development on Motorized T -
Posted By: dorababu08
Created at: Thursday 17th of August 2017 06:41:47 AM
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Driving and the Built Environment: Effects of Compact Development on Motorized Travel, Energy Use, and CO2 Emissions examines the relationship between land development patterns and vehicle miles traveled (VMT) in the United States to assess whether petroleum use, and by extension greenhouse gas (GHG) emissions, could be reduced by changes in the design of development patterns. The report estimates the contributions that changes in residential and mixed-use development patterns and transit investments could make in reducing VMT by 2030 and 205 ....etc

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Title: Built In Self Test of FPGA
Page Link: Built In Self Test of FPGA -
Posted By: anit
Created at: Thursday 05th of October 2017 04:43:48 AM
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Hi.. I m Prasad MC, can anyone please send me the report and code for Built In Self Test of Configurable Logic Blocks of FPGA.. Thank you.. ....etc

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Title: SQL Builtins Pocket Reference
Page Link: SQL Builtins Pocket Reference -
Posted By: vipul naidu
Created at: Thursday 17th of August 2017 06:06:07 AM
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SQL Built ins Pocket Reference



Introduction
The Oracle PL/SQL Built ins Pocket Reference is a quick reference guide to the many built in packages and
functions provided by Oracle Corporation. It contains a concise description of the syntax for the following:
Built in packages
Built in functions
RESTRICT REFERENCES pragmas for the built in packages
Nonprogram elements (e.g., constants, exceptions, etc.) defined in the built in packages
Although we don't inclu ....etc

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Title: BUILT IN SELF TEST FOR A CMOS ALU
Page Link: BUILT IN SELF TEST FOR A CMOS ALU -
Posted By: vineethnsuresh
Created at: Thursday 05th of October 2017 04:37:27 AM
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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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Title: reliability bit built in test doc
Page Link: reliability bit built in test doc -
Posted By: djshan
Created at: Thursday 05th of October 2017 05:36:18 AM
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Hii..
I want paper presentation on built in test intelligence system design or any other topic related to it.. Please provide it on my gmail account [email protected]..

Regards ....etc

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Title: Design and Implementation of BUILT IN SELF TEST BIST
Page Link: Design and Implementation of BUILT IN SELF TEST BIST -
Posted By: sandhya mtu
Created at: Thursday 05th of October 2017 05:30:49 AM
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Design and Implementation of BUILT IN SELF TEST (BIST)

Abstract

The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have no choice but to accept new responsibilities that had been performed by groups of technicians in the previous years. Design engineers who do not design systems with full testability in mind open themselves to the increased possibility of product failures and missed market opportunities. BIST is a design technique that allows a circ ....etc

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Title: how random access memory is built up
Page Link: how random access memory is built up -
Posted By: dheenadhayalan.s
Created at: Thursday 17th of August 2017 06:27:44 AM
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To get more information about the topic random access memory please refer the page link below

http://seminarsprojects.net/Thread-magnetic-ram-full-report?page=2
http://seminarsprojects.net/Thread-nano-ram-seminars-presentation

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Title: improving electrical system reliability with infrared thermography doc
Page Link: improving electrical system reliability with infrared thermography doc -
Posted By: rmsmkp
Created at: Thursday 05th of October 2017 05:21:50 AM
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To get full information or details of improving electrical system reliability with infrared thermography please have a look on the pages

http://seminarsprojects.net/Thread-infrared-thermography--1065

if you again feel trouble on improving electrical system reliability with infrared thermography please reply in that page and ask specific fields in improving electrical system reliability with infrared thermography ....etc

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Title: Built-In Self-Test and Calibration of Mixed-Signal Devices
Page Link: Built-In Self-Test and Calibration of Mixed-Signal Devices -
Posted By: sam432006
Created at: Thursday 17th of August 2017 05:16:45 AM
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Built-In Self-Test and Calibration of Mixed-Signal Devices

Outline
Introduction
Background
BIST Architecture for Mixed-Signal Devices
Overview of Proposed Architecture
Test of DAC/ADC
Calibration of DAC
Sigma-Delta Modulation
Polynomial Fitting Algorithm
Conclusion
Motivation
Digital BIST techniques
Defect-oriented
Logic BIST, scan chain, boundary scan, JTAG, etc
Mixed-Signal BIST techniques
Specification-oriented
No universally accepted standard
Issues
Parameter deviation
Process variation

Appro ....etc

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