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Title: elevator control design based on low cost processor
Page Link: elevator control design based on low cost processor -
Posted By: fuzzu
Created at: Thursday 17th of August 2017 06:24:52 AM
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Title: Embedded Energy Meter- A New Concept To Measure The Energy Consumed By A Consumer A
Page Link: Embedded Energy Meter- A New Concept To Measure The Energy Consumed By A Consumer A -
Posted By: violentc
Created at: Thursday 17th of August 2017 06:43:19 AM
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Embedded Energy Meter- A New Concept To Measure The Energy Consumed By A Consumer And To Pay The Bill

ABSTRACT
In this paper, a new concept of energy meter will be discussed, where maximum demand of energy of a consumer will be indicated in the meter used by the consumer. After exceeding the maximum demand, the meter and hence the connection will automatically be disconnected by an embedded system inserted in the meter itself. According to the maximum demand, the consumer will purchase a cash-card of amount depending on the consumpt ....etc

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Title: Self cascode A promising low voltage Analog design techique
Page Link: Self cascode A promising low voltage Analog design techique -
Posted By: ramya krishnan
Created at: Thursday 17th of August 2017 05:06:31 AM
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Self cascode :A promising low voltage
Analog design techique


Submitted by-
RAMSHANKAR KUMAR
S7,ECE,
DOE,CUSAT


WHY CASCODE BETTER?

IT IS A SINGLE STAGE AMPLIFIER WITH GAIN ENHANCEMENT.
WHILE A CASCADE IS TWO STAGE AMPLIFIER.
IT HAS SINGLE NODE IS AT HIGHER IMPEDENCE,WHERE GAIN IS REALIZED.
IN THIS GBW IS DETERMINED BY INPUT TRANSCONDUCTANCE AND LOAD CAPACITANCE.

Cascode and cascade amplifier

Cascode amplifier is a one stage amplifier with gain enhancement at low frequencies.
It has one ....etc

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Title: Design and Implementation of BUILT IN SELF TEST BIST
Page Link: Design and Implementation of BUILT IN SELF TEST BIST -
Posted By: sandhya mtu
Created at: Thursday 05th of October 2017 05:30:49 AM
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Design and Implementation of BUILT IN SELF TEST (BIST)

Abstract

The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have no choice but to accept new responsibilities that had been performed by groups of technicians in the previous years. Design engineers who do not design systems with full testability in mind open themselves to the increased possibility of product failures and missed market opportunities. BIST is a design technique that allows a circ ....etc

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Title: Low Energy Online Self-Test of Embedded Processors in Dependable WSN Nodes
Page Link: Low Energy Online Self-Test of Embedded Processors in Dependable WSN Nodes -
Posted By: allanshaji
Created at: Thursday 05th of October 2017 03:57:55 AM
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Wireless Sensor Network (WSN) nodes are often deployed in harsh environments where the possibility of permanent and especially intermittent faults due to environmental hazards is significantly increased, while silicon aging effects are also exacerbated. Thus, online and in-field testing is necessary to guarantee correctness of operation. At the same time, online testing of processors integrated in WSN nodes has the requirement of minimum energy consumption, because these devices operate on battery, cannot be connected to any external power supp ....etc

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Title: A New Low Power Test Pattern Generator Using a Variable-Length Ring Counter
Page Link: A New Low Power Test Pattern Generator Using a Variable-Length Ring Counter -
Posted By: ashish1501
Created at: Thursday 17th of August 2017 08:32:07 AM
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A New Low Power Test Pattern Generator Using a Variable-Length Ring Counter



1. Introduction
Built-in Self-Test (BIST) is a design-for-test (DFT)
technique in which testing is achieved through built-in
hardware features. The steps in a typical BIST approach are:
(1) on-chip test pattern generation; (2) application of
patterns to the circuit under test (CUT); (3) analysis of CUT
responses via on-chip output response analyzer (ORA) and
(4) making decision whether chip is faulty ....etc

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Title: Built In Self Test of FPGA
Page Link: Built In Self Test of FPGA -
Posted By: anit
Created at: Thursday 05th of October 2017 04:43:48 AM
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Hi.. I m Prasad MC, can anyone please send me the report and code for Built In Self Test of Configurable Logic Blocks of FPGA.. Thank you.. ....etc

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Title: BUILT IN SELF TEST FOR A CMOS ALU
Page Link: BUILT IN SELF TEST FOR A CMOS ALU -
Posted By: vineethnsuresh
Created at: Thursday 05th of October 2017 04:37:27 AM
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BUILT IN SELF TEST FOR A CMOS ALU

Abstract:- A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinati ....etc

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Title: Built-In Self-Test and Calibration of Mixed-Signal Devices
Page Link: Built-In Self-Test and Calibration of Mixed-Signal Devices -
Posted By: sam432006
Created at: Thursday 17th of August 2017 05:16:45 AM
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Built-In Self-Test and Calibration of Mixed-Signal Devices

Outline
Introduction
Background
BIST Architecture for Mixed-Signal Devices
Overview of Proposed Architecture
Test of DAC/ADC
Calibration of DAC
Sigma-Delta Modulation
Polynomial Fitting Algorithm
Conclusion
Motivation
Digital BIST techniques
Defect-oriented
Logic BIST, scan chain, boundary scan, JTAG, etc
Mixed-Signal BIST techniques
Specification-oriented
No universally accepted standard
Issues
Parameter deviation
Process variation

Appro ....etc

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Title: High-Throughput Low-Cost AES Processor
Page Link: High-Throughput Low-Cost AES Processor -
Posted By: dineshnm22
Created at: Thursday 17th of August 2017 05:33:57 AM
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High-Throughput Low-Cost AES Processor

Chih-Pin Su, Tsung-Fu Lin, Chih-Tsun Huang, and Cheng-Wen Wu, National Tsing Hua University


ABSTRACT

We propose an efficient hardware implementation of the Advanced Encryption Standard algorithm, with key expansion capability. Compared to the widely used table lookup technique, the proposed basis transformation technique reduces the hardware overhead of the S-Box by 64 percent. Our pipelined design has a very high throughput rate. Using typical 0 ....etc

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